Scanning Electron Microscopy
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and…
od 408 €
Výrobca
Springer-Verlag Berlin and Hei
Specifikacia Scanning Electron Microscopy
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Scanning Electron Microscopy
od 408 €
Scanning Probe Microscopy
od 79 €
Diagnostic Electron Microscopy
od 137 €
Transmission Electron Microscopy
od 116 €
Transmission Electron Microscopy
od 115 €
Laser Scanning
od 156 €
Nmap Network Scanning
od 39 €
Atomic Force Microscopy
od 217 €