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Encyclopedia of Scanning Electron Microscopy

Encyclopedia of Scanning Electron Microscopy This book focuses on various issues concerned with scanning electron microscopy, as well as its theoretical and practical applications. SEMs are well…

od 155 €
Výrobca
NY RESEARCH PRESS

Specifikacia Encyclopedia of Scanning Electron Microscopy


Encyclopedia of Scanning Electron Microscopy

This book focuses on various issues concerned with scanning electron microscopy, as well as its theoretical and practical applications. SEMs are well instrumented and supplemented with advanced techniques and methods and thereby present endless possibilities in the areas of quantitative measurement of object topologies, surface imaging, performing elemental analysis and local electrophysical characteristics of semiconductor structures. Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields.

Numerous topics are covered under two sections "Instrumentation, Methodology" and "Biology, Medicine" for electronic industry. Creation of micro and nanostructures involves extensive use of fine focused e-beam. This book includes contributions by renowned researchers and experts in this field.

Encyclopedia of Scanning Electron Microscopy patrí medzi produkty, ktoré ponúkajú vyvážený pomer kvality a ceny. V hornej časti stránky nájdeš hlavný prehľad, nižšie podrobné vlastnosti a technické parametre.

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