Electron Microprobe Analysis and Scanning Electron Microscopy in Geology Reed S. J. B.
Electron Microprobe Analysis and Scanning Electron Microscopy in Geology Reed S. J. B. Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis…
Specifikacia Electron Microprobe Analysis and Scanning Electron Microscopy in Geology Reed S. J. B.
Electron Microprobe Analysis and Scanning Electron Microscopy in Geology Reed S. J. B.
Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results.
The book avoids unnecessary technical detail in order to be easily accessible, and