Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications Haugstad Greg
Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications Haugstad Greg This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one…
Specifikacia Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications Haugstad Greg
Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications Haugstad Greg
This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions. The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations.
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